1. Wrap free return loss test

2. Single multimode wavelength includes: 850/1300/1310/1490/1550/1625nm

3. Multimode light sources can be customized according to IEC/TIA (annular flux) requirements

4. Single configuration for flexible and stable testing

5. Excellent insertion loss stability

6. Can run two different tests simultaneously*

OPL-LOG software

1. This software controls test parameters through USB, high and low temperature box, and detection head * *, and achieves data collection and storage. At the same time, the software can generate a curve chart of insertion loss and return loss, supporting data reading devices and storing data in Excel format.

2. This storage capacity makes OPL-LOG software particularly suitable for long-term high and low temperature testing of optical devices, and meets the requirements of international standards The testing duration and interval can be set, that is, testing can be conducted at any time interval or fixed time interval within any testing time length,

To provide testing efficiency, OPL-LOG can also simultaneously implement two testing requirements under different settings The OP-METS system, in conjunction with the OP-Log software, can customize testing plans according to your application requirements.

*Due to the physical configuration of OP-METS, each test needs to be implemented in sequence, and it is not possible to conduct two tests at the same time

**Please consult us for the high and low temperature boxes and probe models supported by the software